Wafer Patterned Film Inspector from Germany
A wafer patterned film inspector uses ellipso-polarimetric optical technology to inspect thin film stress and thickness uniformity on patterned semiconductor wafers. It uses multiple angles of incidence for complete characterization of deposited films. This advanced optical system is classified under tariff item 9031.41.00 for semiconductor wafer inspection.
Duty Rate — Germany → Canada
0%
Import Tips
• Clearly describe the ellipso-polarimetric measurement method and patterned wafer inspection purpose on customs forms
• The CBSA may require technical specifications to confirm the semiconductor-specific application
• Verify if any chemical or material samples are included that might require separate classification