Wafer Flatness Profiler from Germany
A wafer flatness profiler uses white light interferometry to measure wafer thickness variation and surface flatness. It ensures silicon wafer planarity before lithographic processing in semiconductor manufacturing. This non-contact optical profiler is classified under tariff item 9031.41.00 as an inspection instrument for semiconductor wafers.
Duty Rate — Germany → Canada
0%
Import Tips
• Document the white light interferometry technique and semiconductor-specific purpose in your import declaration
• The CBSA may request evidence that the profiler is not a general-purpose optical measuring device
• Check if any calibration standards or accessories are included in the shipment