Wafer Critical Dimension SEM from Japan
A wafer critical dimension SEM is a scanning electron microscope with optical pre-alignment for measuring critical dimensions on semiconductor wafers post-lithography. Although it primarily uses an electron beam, it includes essential optical wafer handling and positioning systems. This product is classified under tariff item 9031.41.00 because of its optical inspection components for semiconductor wafers.
Duty Rate — Japan → Canada
0%
Import Tips
• Be prepared to demonstrate that the optical pre-alignment and wafer handling features are integral to the inspection function
• The CBSA may question whether the SEM should be classified under heading 90.12 instead
• Provide detailed technical documentation showing the semiconductor-specific application