Structured Light Wafer Scanner from United States
A structured light wafer scanner uses fringe projection to perform full-field 3D shape measurement of semiconductor wafers. It detects subtle global distortions that can affect lithography overlay accuracy. This optical system is classified under tariff item 9031.41.00 as it is specifically designed for inspecting semiconductor wafers.
Duty Rate — United States → Canada
0%
Import Tips
• Document the 3D measurement capability and semiconductor-specific application in your import paperwork
• The CBSA may request proof that the scanner is not a general-purpose optical measuring device
• Consider whether the system includes software that might be classified separately