Nanophoton STARFYRE Reticle Defect Review Station from United States
The Nanophoton STARFYRE is a near-field optical inspection station used for high-resolution review of defects identified by automated reticle inspection tools. It provides sub-50nm defect imaging on photomasks for semiconductor production. This product is classified under tariff item 9031.41.00 as an optical instrument for inspecting photomasks and reticles used in semiconductor device manufacturing.
Duty Rate — United States → Canada
0%
Import Tips
• Confirm that the near-field optical technology qualifies as an optical inspection instrument under 9031.41.00
• The CBSA may ask for evidence that the system is used for semiconductor photomask review
• If the system includes a computer workstation, verify whether it is an integral component for correct valuation