Lasertec MAGICS M-7360 Reticle Inspection Tool from Japan
The Lasertec MAGICS M-7360 is a die-to-database reticle inspection system that uses proprietary MAGICS pattern matching for 10nm+ semiconductor nodes. It detects systematic and random defects on binary and phase-shift masks with ultra-high sensitivity. This system falls under tariff item 9031.41.00 as an optical instrument specifically for inspecting photomasks and reticles in semiconductor manufacturing.
Duty Rate — Japan → Canada
0%
Import Tips
• Document the die-to-database inspection capability to support classification under 9031.41.00
• The CBSA may require a detailed technical description to confirm the system's specific use for semiconductor reticles
• If the system includes a database server or software, ensure these are declared as part of the system's value