KLA-Tencor Surfscan SP7 Unpatterned Wafer Scanner from China
A surface scanning system for bare silicon wafer defectivity mapping using multi-angle darkfield optics and UV laser excitation. Detects haze, flatness deviations, and particles down to 20nm, and is specifically for semiconductor wafer inspection under 9031.41.00.
Duty Rate — China → Canada
0%
Import Tips
• Classify under 9031.41.00 for optical inspection of semiconductor wafers
• Provide evidence of its use in semiconductor manufacturing
• Consider duty relief if used in a certified manufacturing process