CyberOptics SQ3000 Reticle Dimension Metrology Tool from Mexico
The CyberOptics SQ3000 is an advanced 3D dimension metrology system that uses structured light to measure photomask critical dimensions, sidewall angles, and overlay targets. It supports 5nm node requirements for mask qualification, ensuring precision in semiconductor manufacturing. This instrument is classified under tariff item 9031.41.00 as it is specifically designed for inspecting photomasks and reticles used in semiconductor device production.
Duty Rate — Mexico → Canada
Import Tips
• Verify that the structured light technology qualifies as an optical instrument for photomask inspection under 9031.41.00
• Provide the manufacturer's specification sheet to the CBSA if requested, highlighting the 5nm node support
• If the system includes a computer or monitor, confirm whether these are integral parts or separate imports for correct valuation