Confocal Wafer Surface Profiler from China
This confocal wafer surface profiler is a confocal laser scanning optical system that measures 3D topography of semiconductor wafer surfaces at nanometer resolution. It is used for characterizing chemical mechanical polishing (CMP) process uniformity. This instrument is classified under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.
Duty Rate — China → Canada
0%
Import Tips
• Document the confocal laser scanning technology and its specific use for wafer topography measurement to support classification under 9031.41.00
• The CBSA may require evidence of nanometer resolution capabilities
• If the system includes a stage or positioning equipment, verify whether these are integral parts for correct valuation