Camtek EagleR 3D Reticle Metrology System from Germany
The Camtek EagleR is a 3D optical metrology tool used to measure reticle surface topography, overlay marks, and critical dimensions on photomasks. It combines white light interferometry with pattern recognition to achieve sub-1nm precision, making it essential for semiconductor manufacturing quality control. This product falls under tariff item 9031.41.00 as an optical instrument specifically designed for inspecting photomasks and reticles used in semiconductor device production.
Duty Rate — Germany → Canada
Import Tips
• Ensure the product is declared as an optical metrology instrument for semiconductor reticle inspection to qualify for tariff item 9031.41.00
• Have technical documentation ready to demonstrate its specific use for photomasks or reticles, as the CBSA may verify the classification
• Consider whether any accessories or software included with the system should be declared separately to avoid valuation disputes