Bruker ContourGT Reticle Surface Profiler from Germany
A white light interferometric surface profiler optimized for measuring photomask blank surface roughness and topography critical for defect printability analysis. Sub-angstrom resolution meets semiconductor reticle specifications, and this system falls under 9031.41.00 as it inspects photomasks or reticles.
Duty Rate — Germany → Canada
0%
PGA flags
No agency flag on this HTS number in the CBSA Single Window matching criteria.
CBSA Single Window matching criteria, unknown
Import Tips
• Declare under 9031.41.00 as an optical instrument for inspecting semiconductor photomasks
• Provide technical documentation showing its use in semiconductor manufacturing
• Verify eligibility for duty remission under the Machinery Program