Bruker ContourGT Reticle Surface Profiler from China
A white light interferometric surface profiler optimized for measuring photomask blank surface roughness and topography critical for defect printability analysis. Sub-angstrom resolution meets semiconductor reticle specifications, and this instrument falls under tariff item 9031.41.00.
Duty Rate — China → Canada
0%
Import Tips
• Confirm the profiler is used for semiconductor photomask inspection
• Provide CBSA with technical specifications and intended use
• Work with a customs broker to ensure accurate classification