BrightSpot Automation OWL Reticle Inspector from Japan
A programmable illumination reticle inspection system for photomask qualification using multiple wavelength sources and aerial image sensor technology. Used in semiconductor mask houses, this system is classified under 9031.41.00 as it inspects photomasks or reticles used in manufacturing semiconductor devices.
Duty Rate — Japan → Canada
0%
Import Tips
• Declare as an optical inspection instrument for photomasks under 9031.41.00
• Keep documentation on its use for semiconductor photomask qualification
• Verify if the goods are eligible for the Machinery Program duty remission