Automated Wafer Particle Counter from Japan
This automated wafer particle counter is a dark-field optical microscope system that automatically counts and sizes contamination particles on unpatterned semiconductor wafers. It is critical for yield optimization in wafer fabrication cleanrooms. This product falls under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify this counter under 9031.41.00 as it is specifically designed for inspecting semiconductor wafers
• The CBSA may require documentation showing the dark-field optical technology and its use for particle detection
• If the system includes a computer for data analysis, ensure its value is included in the declared transaction value