Applied Materials Verifier Summit Reticle Inspector from Japan
A high-throughput reticle inspection platform using deep ultraviolet (DUV) illumination for detecting critical defects on advanced node photomasks. Features programmable defect classification and recipe-based inspection, and is classified under 9031.41.00 as it inspects photomasks or reticles.
Duty Rate — Japan → Canada
0%
PGA flags
No agency flag on this HTS number in the CBSA Single Window matching criteria.
CBSA Single Window matching criteria, unknown
Import Tips
• Classify under 9031.41.00 for optical inspection of semiconductor photomasks
• Have specifications ready to prove its use in semiconductor manufacturing
• Consider duty deferral if importing for a licensed mask house