Transmission Electron Microscope Specimen Holder from China
Specialized grid holder for thin-section samples in transmission electron microscopes (TEMs), designed for high-vacuum and tilt functionality. This accessory is dedicated to non-optical microscopes for structural analysis.
Duty Rate — China → Canada
0%
Import Tips
• Provide the TEM model and holder specifications to confirm it is a dedicated accessory
• Include handling instructions for high-vacuum components to facilitate CBSA clearance