Electron Microscope Objective Lens from Japan
Precision electromagnetic lens assembly designed for scanning electron microscopes (SEMs) to focus the electron beam. This is a dedicated part for non-optical microscopes, essential for imaging performance.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the lens as a part for SEMs and include the SEM model it fits
• Provide technical drawings or manuals to confirm it is not a general electromagnetic device