Near-Field Scanning Optical Microscope (NSOM) from Japan
A near-field scanning optical microscope (NSOM) achieves resolution beyond the diffraction limit using a sub-wavelength aperture, but it still employs optical detection. Despite its optical nature, it is classified as a specialized non-optical microscope under tariff item 9012.10.00 due to its scanning probe mechanism.
Duty Rate — Japan → Canada
0%
Import Tips
• Provide technical specifications showing the NSOM's scanning probe operation to justify classification under 9012.10.00 rather than optical microscopes
• If the NSOM includes a laser source, ensure it is declared as an integral component