Helium Ion Microscope from Mexico
A helium ion microscope uses a focused beam of helium ions to image surfaces with sub-nanometer resolution, offering minimal sample damage. It is a charged-particle microscope, not an optical one, and is correctly classified under tariff item 9012.10.00.
Duty Rate — Mexico → Canada
0%
Import Tips
• Clearly state the ion-beam technology in the customs declaration to distinguish it from optical microscopes
• If the microscope includes a computer workstation, confirm whether it is a functional unit to avoid separate classification of the computer