Helium Ion Microscope from Japan
A helium ion microscope uses a focused beam of helium ions to image surfaces with sub-nanometer resolution, offering minimal sample damage. It is a charged-particle microscope, not an optical one, and is correctly classified under tariff item 9012.10.00.
Duty Rate — Japan → Canada
PGA flags (1)Show detailsHide detailsHCRadiation Emitting DevicesMay be required
- HC
Radiation Emitting Devices · May be required
May require HC Radiation Emitting Devices depending on Canadian product category (HC40, HC41, HC42, HC43, HC44, HC45). Matching criteria: Equal To 9012100000. Logic: MATCH IF (Valid HS Code) AND (Valid Canadian Product Category).
CBSA Single Window matching criteria, unknown
Import Tips
• Clearly state the ion-beam technology in the customs declaration to distinguish it from optical microscopes
• If the microscope includes a computer workstation, confirm whether it is a functional unit to avoid separate classification of the computer