Atomic Force Microscope (AFM) from Japan
An atomic force microscope (AFM) uses a sharp probe to scan a sample surface, measuring interatomic forces to generate high-resolution 3D topographic images. It operates without optical magnification, relying on mechanical detection, and is therefore classified as a microscope other than an optical microscope under tariff item 9012.10.00.
Duty Rate — Japan → Canada
0%
Import Tips
• Ensure the AFM is declared as a non-optical microscope under tariff item 9012.10.00, and provide technical documentation (e.g
• user manual or datasheet) to support classification
• If the AFM includes a computer for control, confirm whether it is presented as a functional unit to avoid separate classification of the computer