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Defective Gold-Plated Semiconductor Test Probes from Mexico

Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse. It qualifies under this tariff item as electrical and electronic waste for precious metal recovery.

Duty Rate — Mexico → Canada

0%

PGA flags

No agency flag on this HTS number in the CBSA Single Window matching criteria.

CBSA Single Window matching criteria, unknown

Import Tips

• Classify the probes as electrical and electronic waste, ensuring they are not shipped in a manner protecting individual articles

• Provide evidence of their non-functional status and precious metal content

• Consult CBSA for any additional documentation on waste imports

Defective Gold-Plated Semiconductor Test Probes from Mexico — Import Duty Rate | Tariff item 8549.29.00