Defective Gold-Plated Semiconductor Test Probes from Japan
Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse, and is unfit for its original purpose.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the probes as waste and scrap under heading 85.49, as they are unusable for their original purpose
• Ensure the shipment is not packaged to protect individual articles, per Section Note 6
• Keep records of the metal content to support the classification