Defective Gold-Plated Semiconductor Test Probes from Japan
Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse. It qualifies under this tariff item as electrical and electronic waste for precious metal recovery.
Duty Rate — Japan → Canada
0%
PGA flags
No agency flag on this HTS number in the CBSA Single Window matching criteria.
CBSA Single Window matching criteria, unknown
Import Tips
• Classify the probes as electrical and electronic waste, ensuring they are not shipped in a manner protecting individual articles
• Provide evidence of their non-functional status and precious metal content
• Consult CBSA for any additional documentation on waste imports