Defective Gold-Plated Semiconductor Test Probes from China
Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse. It qualifies under this tariff item as electrical and electronic waste for precious metal recovery.
Duty Rate — China → Canada
0%
Import Tips
• Classify the probes as electrical and electronic waste, ensuring they are not shipped in a manner protecting individual articles
• Provide evidence of their non-functional status and precious metal content
• Consult CBSA for any additional documentation on waste imports