PVD Quartz Crystal Monitor Sensor from Japan
A sensor using quartz crystal microbalance to measure film thickness in real-time during PVD processes. It is mounted inside deposition chambers of 8543.70 apparatus for precise process control, vital for quality assurance.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify as a part of PVD apparatus under 8543.70; provide details on the sensor's integration
• Ensure it is not classified as a measuring instrument of Chapter 90
• Confirm the quartz crystal is not classified separately