Samtec SEARAY Wafer Test Probes from United States
The Samtec SEARAY Wafer Test Probes are high-density spring probe arrays used for wafer-level IC burn-in testing at voltages below 1,000V. They make precise electrical connections to test points on semiconductor wafers. This product falls under tariff item 8536.90.00 as other apparatus for making connections in electrical circuits.
Duty Rate — United States → Canada
0%
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Import Tips
• Declare the probes as electrical connection apparatus under 8536.90.00, not as parts of testing machines
• Provide technical specifications showing voltage rating and intended use
• Verify if the product is subject to any export controls or special permits