Samtec SEARAY Wafer Test Probes from Mexico
> Samtec SEARAY Wafer Test Probes are high-density spring probe arrays for wafer-level IC burn-in testing. They make electrical connections to test points and are classified under 8536.90.00 as other apparatus.
Duty Rate — Mexico → Canada
0%
Import Tips
• > Declare the probes as electrical test apparatus under 8536.90.00
• Provide detailed specifications to CBSA to avoid misclassification
• Consider if the probes are parts of testing machines, which might fall under a different heading