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Samtec SEARAY Wafer Test Probes from Mexico

> Samtec SEARAY Wafer Test Probes are high-density spring probe arrays for wafer-level IC burn-in testing. They make electrical connections to test points and are classified under 8536.90.00 as other apparatus.

Duty Rate — Mexico → Canada

0%

Import Tips

• > Declare the probes as electrical test apparatus under 8536.90.00

• Provide detailed specifications to CBSA to avoid misclassification

• Consider if the probes are parts of testing machines, which might fall under a different heading

Samtec SEARAY Wafer Test Probes from Mexico — Import Duty Rate | Tariff item 8536.90.00