Microtech KnitLine Wafer Probes from Mexico
Microtech KnitLine Wafer Probes are Kelvin four-point probes used for precise wafer resistance measurement in semiconductor testing. They make electrical connections to test points at voltages below 1,000V. This product falls under tariff item 8536.90.00 as other apparatus for making connections in electrical circuits.
Duty Rate — Mexico → Canada
0%
Import Tips
• Declare the probes as electrical connection apparatus under 8536.90.00, not as parts of testing machines
• Provide technical specifications showing voltage rating and intended use
• Verify if the product is subject to any export controls or special permits