8536.90.00/Cascade Microtech Wafer Prober Probes/Japan

Cascade Microtech Wafer Prober Probes from Japan

Cascade Microtech Wafer Prober Probes are high-precision tungsten carbide probes used in semiconductor wafer testing equipment to make electrical connections to test points. They operate at voltages below 1,000V and are essential for low-voltage circuit testing during manufacturing. These probes fall under tariff item 8536.90.00 as other apparatus for making connections in electrical circuits.

Duty Rate — Japan → Canada

Calculate with your customs value Verify with the Tariff Assistant

Import Tips

• Declare the probes as electrical connection apparatus under 8536.90.00, not as parts of testing machines

• Provide technical specifications showing voltage rating and intended use

• Verify if the probes are subject to export controls or require special permits