Wafer Inspection Stepper Interface PCA from United States
This PCA controls stage motion in step-and-repeat wafer inspection systems mapping defects pre-lithography. It achieves sub-micron alignment during inspection. As a printed circuit accessory for machines of heading 84.71, it falls under tariff item 8473.30.20.
Duty Rate — United States → Canada
0%
Import Tips
• Ensure the PCA is declared as a part of machines of heading 84.71
• Have documentation showing its use in wafer inspection systems
• Check if the goods qualify for preferential tariff treatment under Canada's free trade agreements